Reliability Prediction for Microelectronics (1st Edition) by Emmanuel Bender ISBN13: 9781394210930
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- Pages
- 401
- File size
- 32.35 MB
- Format
- Digital PDF
- Course
- Engineering
- Category
- eBook[PDF]
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About this ebook
Reliability Prediction for Microelectronics (1st Edition) is an authoritative engineering textbook published by John Wiley & Sons in early 2024. Co-authored by Emmanuel Bender, Joseph B. Bernstein, and Alain Bensoussan, this work is a key text in the Quality and Reliability Engineering Series. [1, 2, 3]
Quick Overview
- ISBN-13: 978-1394210930 (Hardcover)
- ISBN-10: 1394210930
- Page Count: ~400 pages
- Target Audience: Microelectronics reliability engineers, circuit design engineers, and advanced STEM students. [1, 2, 3]
Core Focus & Key Themes
The book shifts focus away from traditional, outdated empirical reliability methods toward modern, physics-backed predictive modeling. [1]
- Physics of Failure (PoF): The book centers on understanding the fundamental physical and chemical mechanisms that cause component degradation. [1, 2, 3]
- Deep Submicron (DSM) Challenges: It tackles specialized multi-physics failure mechanisms found in nano-scale devices, including:
- Remaining Useful Life (RUL): Provides tools to accurately calculate RUL and assess failure rates under real operational stresses rather than relying on idealized assumptions. [1]
- Advanced Accelerated Testing: Explores how to properly scale up stress factors (like voltage and temperature) to quantify failure risks without introducing unrealistic artifact failures. [1, 2]
Co-Author Backgrounds
- Emmanuel Bender, PhD: Specializes in microelectronics reliability, having completed his doctoral work in Electrical and Electronics Engineering at Ariel University. [1]
- Joseph B. Bernstein, PhD: Senior IEEE member and Director of the Laboratory for Failure Analysis and Reliability of Electronic Systems at Ariel University. [1]
- Alain A. Bensoussan, PhD: Expert consulting engineer with extensive industrial experience specializing in optics and optoelectronic components at Thales Alenia Space. [1]
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Reliability-Prediction-for-Microelectronics.pdf
32.35 MB
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